Reed D. Meyer
REED D. MEYER
Also available: Single page
version suitable for printing

(PDF format)
Center for Imaging Science
Rochester Institute of Technology
54 Lomb Memorial Drive
Rochester, NY 14623-5604
(585) 475-7781
FAX: (585) 475-5988
rxm128@yahoo.com
U.S. Citizen

Objective An information technology position that profits from a strong
background in science, numerical analysis, and similar areas.

Education

Academic Honors & Awards
More honors and awards

Organizations

Avocations

Bibliography

Over twenty scientific publications, including two theses and six refereed journal articles. Other works include computer software, graphic arts, literature, and musical compositions.

Computer Experience
  • Scientific programming. Instrumentation, data reduction and analysis, and physical simulations. Ample experience with device drivers, function optimization, and statistical techniques.
  • Programming languages. C/C++ since 1990. Also proficient in FORTRAN, IDL, BASIC, and HTML. Familiar with several other languages.
  • System Administration. Assembled and maintained more than 15 Linux and Windows machines, including two small networks. Linux server administrator.
Details

Research Experience
  • 2002–present: Post-doctoral Fellow, Rochester Institute of Technology (RIT). Co-developed RITMOS, the first operational multi-object spectrometer to use a micromirror array.
  • 2000–2001: Research Assistant, RIT. Built RYTSI, the RIT–Yale Tip-tilt Speckle Imager.
  • 1994–2000: Research Assistant, Yale. Measured binary star differential magnitudes. Upgraded telescope instrumentation in Argentina.
  • 1990, 1992–1993: Undergraduate Research Assistant, Penn State.
Details, including fields of expertise

Teaching Experience
  • 2002–2003: Adjunct Assistant Professor, RIT. Taught “Programming for Imaging Science II.”
  • 1994–1999: Teaching Assistant, Yale. Gained roughly 1,250 hours of experience assisting seven undergraduate classes.
  • 1991: Peer Tutor in Writing, Penn State.
Employment history, including teaching details

References

Contact information available upon request.